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https://scholarbank.nus.edu.sg/handle/10635/158745
| Title: | A COMPARATIVE STUDY OF RELIABILITY IN THIN GATE OXIDES SUBJECTED TO ELECTRON-BEAM IRRADIATION AND TO ELECTRICAL STRESS | Authors: | CHONG PEI FEN | Issue Date: | 2001 | Citation: | CHONG PEI FEN (2001). A COMPARATIVE STUDY OF RELIABILITY IN THIN GATE OXIDES SUBJECTED TO ELECTRON-BEAM IRRADIATION AND TO ELECTRICAL STRESS. ScholarBank@NUS Repository. | URI: | https://scholarbank.nus.edu.sg/handle/10635/158745 |
| Appears in Collections: | Master's Theses (Restricted) |
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| b22769237.PDF | 4.69 MB | Adobe PDF | RESTRICTED | None | Log In |
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