Please use this identifier to cite or link to this item:
https://scholarbank.nus.edu.sg/handle/10635/158713
| Title: | ELECTROMIGRATION IN YBa2Cu3O7-8 MICROBRIDGES | Authors: | SIM SZE KUAN | Issue Date: | 1999 | Citation: | SIM SZE KUAN (1999). ELECTROMIGRATION IN YBa2Cu3O7-8 MICROBRIDGES. ScholarBank@NUS Repository. | URI: | https://scholarbank.nus.edu.sg/handle/10635/158713 |
| Appears in Collections: | Master's Theses (Restricted) |
Show full item record
Files in This Item:
| File | Description | Size | Format | Access Settings | Version | |
|---|---|---|---|---|---|---|
| B22628289.PDF | 1.54 MB | Adobe PDF | RESTRICTED | None | Log In |
Google ScholarTM
Check
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.