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https://scholarbank.nus.edu.sg/handle/10635/158710
| Title: | A STUDY OF THE QUASI-BREAKDOWN MECHANISM IN ULTRA-THIN GATE OXIDE | Authors: | XU ZHEN | Issue Date: | 2001 | Citation: | XU ZHEN (2001). A STUDY OF THE QUASI-BREAKDOWN MECHANISM IN ULTRA-THIN GATE OXIDE. ScholarBank@NUS Repository. | URI: | https://scholarbank.nus.edu.sg/handle/10635/158710 |
| Appears in Collections: | Master's Theses (Restricted) |
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