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Please use this identifier to cite or link to this item: https://doi.org/10.1364/oe.17.018271
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dc.titleSoft x-ray free electron laser microfocus for exploring matter under extreme conditions
dc.contributor.authorNELSON, AJ
dc.contributor.authorTOLEIKIS, S
dc.contributor.authorCHAPMAN, H
dc.contributor.authorBAJT, S
dc.contributor.authorKRZYWINSKI, J
dc.contributor.authorCHALUPSKY, J
dc.contributor.authorJUHA, L
dc.contributor.authorCIHELKA, J
dc.contributor.authorHAJKOVA, V
dc.contributor.authorVYSIN, L
dc.contributor.authorBURIAN, T
dc.contributor.authorKOZLOVA, M
dc.contributor.authorFäUSTLIN, RR
dc.contributor.authorNAGLER, B
dc.contributor.authorVINKO, SM
dc.contributor.authorWHITCHER, T
dc.contributor.authorDZELZAINIS, T
dc.contributor.authorRENNER, O
dc.contributor.authorSAKSL, K
dc.contributor.authorKHORSAND, AR
dc.contributor.authorHEIMANN, PA
dc.contributor.authorSOBIERAJSKI, R
dc.contributor.authorKLINGER, D
dc.contributor.authorJUREK, M
dc.contributor.authorPELKA, J
dc.contributor.authorIWAN, B
dc.contributor.authorANDREASSON, J
dc.contributor.authorTIMNEANU, N
dc.contributor.authorFAJARDO, M
dc.contributor.authorWARK, JS
dc.contributor.authorRILEY, D
dc.contributor.authorTSCHENTSCHER, T
dc.contributor.authorHAJDU, J
dc.contributor.authorLEE, RW
dc.date.accessioned2019-06-04T03:24:08Z
dc.date.available2019-06-04T03:24:08Z
dc.date.issued2009-09-28
dc.identifier.citationNELSON, AJ, TOLEIKIS, S, CHAPMAN, H, BAJT, S, KRZYWINSKI, J, CHALUPSKY, J, JUHA, L, CIHELKA, J, HAJKOVA, V, VYSIN, L, BURIAN, T, KOZLOVA, M, FäUSTLIN, RR, NAGLER, B, VINKO, SM, WHITCHER, T, DZELZAINIS, T, RENNER, O, SAKSL, K, KHORSAND, AR, HEIMANN, PA, SOBIERAJSKI, R, KLINGER, D, JUREK, M, PELKA, J, IWAN, B, ANDREASSON, J, TIMNEANU, N, FAJARDO, M, WARK, JS, RILEY, D, TSCHENTSCHER, T, HAJDU, J, LEE, RW (2009-09-28). Soft x-ray free electron laser microfocus for exploring matter under extreme conditions. Optics Express 17 (20) : 18271-18271. ScholarBank@NUS Repository. https://doi.org/10.1364/oe.17.018271
dc.identifier.issn10944087
dc.identifier.urihttps://scholarbank.nus.edu.sg/handle/10635/155138
dc.publisherThe Optical Society
dc.sourceElements
dc.typeArticle
dc.date.updated2019-06-03T06:48:04Z
dc.contributor.departmentCENTRE FOR ADVANCED 2D MATERIALS
dc.description.doi10.1364/oe.17.018271
dc.description.sourcetitleOptics Express
dc.description.volume17
dc.description.issue20
dc.description.page18271-18271
dc.published.statePublished
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