Please use this identifier to cite or link to this item: https://doi.org/10.1088/0022-3727/47/5/055109
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dc.titleDetermination of energy levels at the interface between O2 plasma treated ITO/P3HT : PCBM and PEDOT : PSS/P3HT : PCBM using angular-resolved x-ray and ultraviolet photoelectron spectroscopy
dc.contributor.authorWhitcher, Thomas J
dc.contributor.authorTalik, Noor Azrina
dc.contributor.authorWoon, Kailin
dc.contributor.authorChanlek, Narong
dc.contributor.authorNakajima, Hideki
dc.contributor.authorSaisopa, Thanit
dc.contributor.authorSongsiriritthigul, Prayoon
dc.date.accessioned2019-06-04T03:11:57Z
dc.date.available2019-06-04T03:11:57Z
dc.date.issued2014-02-05
dc.identifier.citationWhitcher, Thomas J, Talik, Noor Azrina, Woon, Kailin, Chanlek, Narong, Nakajima, Hideki, Saisopa, Thanit, Songsiriritthigul, Prayoon (2014-02-05). Determination of energy levels at the interface between O2 plasma treated ITO/P3HT : PCBM and PEDOT : PSS/P3HT : PCBM using angular-resolved x-ray and ultraviolet photoelectron spectroscopy. Journal of Physics D: Applied Physics 47 (5) : 055109-055109. ScholarBank@NUS Repository. https://doi.org/10.1088/0022-3727/47/5/055109
dc.identifier.issn0022-3727
dc.identifier.issn1361-6463
dc.identifier.urihttps://scholarbank.nus.edu.sg/handle/10635/155132
dc.publisherIOP Publishing
dc.sourceElements
dc.typeArticle
dc.date.updated2019-06-03T06:36:32Z
dc.contributor.departmentCENTRE FOR ADVANCED 2D MATERIALS
dc.description.doi10.1088/0022-3727/47/5/055109
dc.description.sourcetitleJournal of Physics D: Applied Physics
dc.description.volume47
dc.description.issue5
dc.description.page055109-055109
dc.published.statePublished
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