Please use this identifier to cite or link to this item: https://scholarbank.nus.edu.sg/handle/10635/153954
Title: YIELD IMPROVEMENT FOR AN ACTUAL 65NM PRODUCT
Authors: SONG YANG
Keywords: Chartered Semiconductor
Process Integration
Yield
RTA
Issue Date: 2008
Citation: SONG YANG (2008). YIELD IMPROVEMENT FOR AN ACTUAL 65NM PRODUCT. ScholarBank@NUS Repository.
Abstract: This report is regarding my industrial attachment at Chartered Semiconductor Manufacturing Ltd. Fab 7 Process Integration department from July 2008 to December 2008. Process integration (PI) is the synthesis of process control, process engineering and process modeling and simulation into tools that can deal with the large quantities of operating data now available from process information systems. It offers the promise of improved control and management of operating efficiencies, energy use, environmental impacts, capital effectiveness, process design, and operations management. Working as a PI engineer, it is supposed to screen out promising options to optimize the design and operation of a process plant. It is often employed in conjunction with simulation and mathematical optimization tools to identify opportunities in order to better integrate a system (new or existing) and reduce capital or operating costs, as well as fulfilling customers' requests.
URI: https://scholarbank.nus.edu.sg/handle/10635/153954
Appears in Collections:Master's Theses (Restricted)

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