Please use this identifier to cite or link to this item: https://doi.org/10.1149/05701.1701ecst
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dc.titleThe application of ion beam analysis to mass transport studies in mixed electronic ionic conducting electrodes
dc.contributor.authorKilner J.A.
dc.contributor.authorTellez Lozano H.
dc.contributor.authorBurriel M.
dc.contributor.authorCook S.
dc.contributor.authorDruce J.
dc.date.accessioned2018-11-29T07:16:07Z
dc.date.available2018-11-29T07:16:07Z
dc.date.issued2013
dc.identifier.citationKilner J.A., Tellez Lozano H., Burriel M., Cook S., Druce J. (2013). The application of ion beam analysis to mass transport studies in mixed electronic ionic conducting electrodes. ECS Transactions 57 (1) : 1701-1708. ScholarBank@NUS Repository. https://doi.org/10.1149/05701.1701ecst
dc.identifier.issn19385862
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/149263
dc.description.abstractThe measurement of the mass transport and oxygen exchange in materials for SOFCs has been greatly aided by the use of ion beam analysis techniques. In particular this has focused on the use of Secondary Ion Mass Spectrometry (SIMS) to measure diffusion profiles of oxygen 18 in ceramics to determine the kinetics of the bulk transport of oxygen. A second ion beam technique, Low Energy Ion Scattering (LEIS) can provide important information about the composition of the outermost atomic layers of the same materials where the gas/solid oxygen exchange process is taking place. The application of the newer technique of LEIS to materials for air electrodes is discussed and the behaviour of some common perovskite materials is explored. � The Electrochemical Society.
dc.publisherElectrochemical Society Inc.
dc.sourceScopus
dc.typeConference Paper
dc.contributor.departmentDUKE-NUS MEDICAL SCHOOL
dc.description.doi10.1149/05701.1701ecst
dc.description.sourcetitleECS Transactions
dc.description.volume57
dc.description.issue1
dc.description.page1701-1708
dc.published.statepublished
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