Please use this identifier to cite or link to this item: https://doi.org/10.1109/CVPR.2008.4587754
DC FieldValue
dc.titleLearning patch correspondences for improved viewpoint invariant face recognition
dc.contributor.authorAshraf A.B.
dc.contributor.authorLucey S.
dc.contributor.authorChen T.
dc.date.accessioned2018-08-21T05:05:00Z
dc.date.available2018-08-21T05:05:00Z
dc.date.issued2008
dc.identifier.citationAshraf A.B., Lucey S., Chen T. (2008). Learning patch correspondences for improved viewpoint invariant face recognition. 26th IEEE Conference on Computer Vision and Pattern Recognition, CVPR : 4587754. ScholarBank@NUS Repository. https://doi.org/10.1109/CVPR.2008.4587754
dc.identifier.isbn9781424422432
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/146233
dc.description.abstractVariation due to viewpoint is one of the key challenges that stand in the way of a complete solution to the face recognition problem. It is easy to note that local regions of the face change differently in appearance as the viewpoint varies. Recently, patch-based approaches, such as those of Kanade and Yamada, have taken advantage of this effect resulting in improved viewpoint invariant face recognition. In this paper we propose a data-driven extension to their approach, in which we not only model how a face patch varies in appearance, but also how it deforms spatially as the viewpoint varies. We propose a novel alignment strategy which we refer to as "stack flow" that discovers viewpoint induced spatial deformities undergone by a face at the patch level. One can then view the spatial deformation of a patch as the correspondence of that patch between two viewpoints. We present improved identification and verification results to demonstrate the utility of our technique.
dc.sourceScopus
dc.typeConference Paper
dc.contributor.departmentOFFICE OF THE PROVOST
dc.contributor.departmentDEPARTMENT OF COMPUTER SCIENCE
dc.description.doi10.1109/CVPR.2008.4587754
dc.description.sourcetitle26th IEEE Conference on Computer Vision and Pattern Recognition, CVPR
dc.description.page4587754
dc.published.statepublished
Appears in Collections:Staff Publications

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