Please use this identifier to cite or link to this item:
https://doi.org/10.1109/AIPR.2008.4906451
DC Field | Value | |
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dc.title | Investigating useful and distinguishing features around the eyelash region | |
dc.contributor.author | Li Y.-H. | |
dc.contributor.author | Savvides M. | |
dc.contributor.author | Chen T. | |
dc.date.accessioned | 2018-08-21T05:04:22Z | |
dc.date.available | 2018-08-21T05:04:22Z | |
dc.date.issued | 2008 | |
dc.identifier.citation | Li Y.-H., Savvides M., Chen T. (2008). Investigating useful and distinguishing features around the eyelash region. Proceedings - Applied Imagery Pattern Recognition Workshop : 4906451. ScholarBank@NUS Repository. https://doi.org/10.1109/AIPR.2008.4906451 | |
dc.identifier.isbn | 9781424431250 | |
dc.identifier.issn | 15505219 | |
dc.identifier.uri | http://scholarbank.nus.edu.sg/handle/10635/146224 | |
dc.description.abstract | Traditionally, iris recognition is always about analyzing and extracting features from iris texture. We proposed to investigate regions around eyelashes and extract useful information which helps us to perform ethnic classification. We propose an algorithm which is easy to implement and effective. First, we locate eyelash region by using ASM to model eyelid boundary. Second, we extract local patch around local landmarks. After image processing, we are able to separate eyelashes and extract features from the directions of eyelashes. Those features are descriptive and can be used to train classifiers. Experimental results show our method can successfully perform East-Asian/Caucasian classification up to 93% accuracy, which shows our proposed method is useful and promising. | |
dc.source | Scopus | |
dc.subject | ASM | |
dc.subject | Ethnic classification | |
dc.subject | Eyelash analysis | |
dc.subject | Soft biometrics | |
dc.type | Conference Paper | |
dc.contributor.department | OFFICE OF THE PROVOST | |
dc.contributor.department | DEPARTMENT OF COMPUTER SCIENCE | |
dc.description.doi | 10.1109/AIPR.2008.4906451 | |
dc.description.sourcetitle | Proceedings - Applied Imagery Pattern Recognition Workshop | |
dc.description.page | 4906451 | |
dc.published.state | published | |
Appears in Collections: | Staff Publications |
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