Please use this identifier to cite or link to this item: https://doi.org/10.1109/AIPR.2008.4906451
DC FieldValue
dc.titleInvestigating useful and distinguishing features around the eyelash region
dc.contributor.authorLi Y.-H.
dc.contributor.authorSavvides M.
dc.contributor.authorChen T.
dc.date.accessioned2018-08-21T05:04:22Z
dc.date.available2018-08-21T05:04:22Z
dc.date.issued2008
dc.identifier.citationLi Y.-H., Savvides M., Chen T. (2008). Investigating useful and distinguishing features around the eyelash region. Proceedings - Applied Imagery Pattern Recognition Workshop : 4906451. ScholarBank@NUS Repository. https://doi.org/10.1109/AIPR.2008.4906451
dc.identifier.isbn9781424431250
dc.identifier.issn15505219
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/146224
dc.description.abstractTraditionally, iris recognition is always about analyzing and extracting features from iris texture. We proposed to investigate regions around eyelashes and extract useful information which helps us to perform ethnic classification. We propose an algorithm which is easy to implement and effective. First, we locate eyelash region by using ASM to model eyelid boundary. Second, we extract local patch around local landmarks. After image processing, we are able to separate eyelashes and extract features from the directions of eyelashes. Those features are descriptive and can be used to train classifiers. Experimental results show our method can successfully perform East-Asian/Caucasian classification up to 93% accuracy, which shows our proposed method is useful and promising.
dc.sourceScopus
dc.subjectASM
dc.subjectEthnic classification
dc.subjectEyelash analysis
dc.subjectSoft biometrics
dc.typeConference Paper
dc.contributor.departmentOFFICE OF THE PROVOST
dc.contributor.departmentDEPARTMENT OF COMPUTER SCIENCE
dc.description.doi10.1109/AIPR.2008.4906451
dc.description.sourcetitleProceedings - Applied Imagery Pattern Recognition Workshop
dc.description.page4906451
dc.published.statepublished
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