Please use this identifier to cite or link to this item: https://doi.org/10.1017/S0263034613000608
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dc.titleAnalysis of selective vaporization behavior in laser melting of magnesium alloy by plume deposition
dc.contributor.authorGuan, Y.
dc.contributor.authorZhou, W.
dc.contributor.authorZheng, H.
dc.contributor.authorLi, Z.
dc.contributor.authorLeng, S.H.
dc.contributor.authorHong, M.
dc.date.accessioned2016-06-03T08:07:57Z
dc.date.available2016-06-03T08:07:57Z
dc.date.issued2014
dc.identifier.citationGuan, Y., Zhou, W., Zheng, H., Li, Z., Leng, S.H., Hong, M. (2014). Analysis of selective vaporization behavior in laser melting of magnesium alloy by plume deposition. Laser and Particle Beams 32 (1) : 49-54. ScholarBank@NUS Repository. https://doi.org/10.1017/S0263034613000608
dc.identifier.issn1469803X
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/125095
dc.description.abstractLaser surface melting is one of the most important processes in laser material processing. Selective vaporization of alloying elements in laser melting offers fundamental understanding of laser processing on metallic alloys. This work provides linkage between laser melting and material properties using secondary ion mass spectrometry (SIMS) for tiny vaporized species in laser-generated plume and energy dispersive spectroscopy (EDS) for solid solution range in molten pool, both qualitatively and quantitatively (up to hundreds of micron). Silicon wafer was used to collect the generated plume. Chemical analysis was carried out on top surface and sub-surface of the deposited plume. Transport behavior as well as distribution of the vaporized species inside the plume was further proposed. © Cambridge University Press, 2013.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1017/S0263034613000608
dc.sourceScopus
dc.subjectLaser processing
dc.subjectMagnesium alloy
dc.subjectSecondary ion mass spectrometry
dc.subjectSelective vaporization
dc.subjectSurface modification
dc.typeArticle
dc.contributor.departmentELECTRICAL & COMPUTER ENGINEERING
dc.description.doi10.1017/S0263034613000608
dc.description.sourcetitleLaser and Particle Beams
dc.description.volume32
dc.description.issue1
dc.description.page49-54
dc.description.codenLPBED
dc.identifier.isiut000332688800007
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