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Please use this identifier to cite or link to this item: https://doi.org/10.1016/j.triboint.2014.08.001
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dc.titleProbing the role of C+ ion energy, thickness and graded structure on the functional and microstructural characteristics of ultrathin carbon films (<2 nm)
dc.contributor.advisornull
dc.contributor.authorGoohpattader, Partho Sarathi
dc.contributor.authorDwivedi, Neeraj
dc.contributor.authorRismani-Yazdi, Ehsan
dc.contributor.authorSatyanarayana, Nalam
dc.contributor.authorYeo, Reuben
dc.contributor.authorKundu, Shreya
dc.contributor.authorBhatia, Charanjit Singh
dc.date.accessioned2016-05-06T03:51:01Z
dc.date.available2016-05-06T03:51:01Z
dc.date.issued2015
dc.identifier.citationGoohpattader, Partho Sarathi, Dwivedi, Neeraj, Rismani-Yazdi, Ehsan, Satyanarayana, Nalam, Yeo, Reuben, Kundu, Shreya, Bhatia, Charanjit Singh (2015). Probing the role of C+ ion energy, thickness and graded structure on the functional and microstructural characteristics of ultrathin carbon films (<2 nm). Tribology International 81 : 73-88. ScholarBank@NUS Repository. https://doi.org/10.1016/j.triboint.2014.08.001
dc.identifier.issn0301679X
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/123806
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1016/j.triboint.2014.08.001
dc.publisherElsevier
dc.typeArticle
dc.contributor.departmentELECTRICAL & COMPUTER ENGINEERING
dc.description.doi10.1016/j.triboint.2014.08.001
dc.description.sourcetitleTribology International
dc.description.volume81
dc.description.page73-88
dc.identifier.isiut000345469200009
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