Please use this identifier to cite or link to this item: https://doi.org/10.1063/1.2802188
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dc.titleField-induced meniscus dynamics and its impact on the nanoscale tip-surface interface
dc.contributor.authorXie, X.N.
dc.contributor.authorChung, H.J.
dc.contributor.authorTong, D.M.
dc.contributor.authorSow, C.H.
dc.contributor.authorWee, A.T.S.
dc.date.accessioned2014-12-12T08:04:33Z
dc.date.available2014-12-12T08:04:33Z
dc.date.issued2007
dc.identifier.citationXie, X.N., Chung, H.J., Tong, D.M., Sow, C.H., Wee, A.T.S. (2007). Field-induced meniscus dynamics and its impact on the nanoscale tip-surface interface. Journal of Applied Physics 102 (8) : -. ScholarBank@NUS Repository. https://doi.org/10.1063/1.2802188
dc.identifier.issn00218979
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/117348
dc.description.abstractWe describe the spatiotemporal evolution of the nanoscale tip-surface junction during field-induced water meniscus formation in the junction. The motion of the meniscus and tip was analyzed on the basis of typical parameters concerning the nanoscale meniscus and tip-surface configuration. Being attracted by the electric field, the meniscus generates a repulsive hydrodynamic impact force counteracting the electrostatic force on the tip. The imbalance of the forces leads to an increase of the tip-surface separation distance, and the increase is related to the initial experimental parameters including tip bias voltage and tip spring constant. An explicit equation was derived for the estimation of the tip-surface junction enlargement effect. The theoretical results were confirmed by atomic force microscope (AFM) in situ observations of tip repulsion under electric fields. The induced tip-surface junction enlargement has significant implications in AFM nanolithography, e.g., it could facilitate the formation of nanostructures with high vertical dimensions/aspect ratios. © 2007 American Institute of Physics.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1063/1.2802188
dc.sourceScopus
dc.typeReview
dc.contributor.departmentNUS NANOSCIENCE & NANOTECH INITIATIVE
dc.contributor.departmentPHYSICS
dc.description.doi10.1063/1.2802188
dc.description.sourcetitleJournal of Applied Physics
dc.description.volume102
dc.description.issue8
dc.description.page-
dc.description.codenJAPIA
dc.identifier.isiut000250589300123
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