Please use this identifier to cite or link to this item: https://doi.org/10.1063/1.4712532
DC FieldValue
dc.titleDiluted antiferromagnet effect on magnetic and microwave characteristics of exchange-biased multilayered thin films
dc.contributor.authorPhuoc, N.N.
dc.contributor.authorOng, C.K.
dc.date.accessioned2014-12-12T07:48:07Z
dc.date.available2014-12-12T07:48:07Z
dc.date.issued2012-05-01
dc.identifier.citationPhuoc, N.N., Ong, C.K. (2012-05-01). Diluted antiferromagnet effect on magnetic and microwave characteristics of exchange-biased multilayered thin films. Journal of Applied Physics 111 (9) : -. ScholarBank@NUS Repository. https://doi.org/10.1063/1.4712532
dc.identifier.issn00218979
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/116295
dc.description.abstractA comprehensive experimental study of the effect of antiferromagnetic (AF) dilution on the magnetic properties and microwave characteristics of Fe 70Co 30/(Mn 75Ir 25) 1-x(Al 2O 3) x multilayered thin films with the variation of AF thickness was performed. Our result reveals a linear relationship between the critical AF thickness and the dilution of the AF layers providing an evidence of a volume effect in the AF layers consistent with the domain state model. The AF magnetic anisotropy deduced from the critical AF thickness was found to reduce monotonically with the AF dilution. The variations of exchange bias, rotational magnetic anisotropy, ferromagnetic resonance frequency, and effective damping factor with the AF dilution and thickness have also been presented and discussed. © 2012 American Institute of Physics.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1063/1.4712532
dc.sourceScopus
dc.typeArticle
dc.contributor.departmentPHYSICS
dc.contributor.departmentTEMASEK LABORATORIES
dc.description.doi10.1063/1.4712532
dc.description.sourcetitleJournal of Applied Physics
dc.description.volume111
dc.description.issue9
dc.description.page-
dc.description.codenJAPIA
dc.identifier.isiut000304109900098
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