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Please use this identifier to cite or link to this item: https://doi.org/10.1016/j.jprocont.2008.11.002
DC FieldValue
dc.titleEditorial
dc.contributor.authorQin, S.J.
dc.contributor.authorHsieh, M.
dc.contributor.authorEpstein, D.J.
dc.contributor.authorHo, W.K.
dc.date.accessioned2014-12-02T08:06:19Z
dc.date.available2014-12-02T08:06:19Z
dc.date.issued2008-12
dc.identifier.citationQin, S.J., Hsieh, M., Epstein, D.J., Ho, W.K. (2008-12). Editorial. Journal of Process Control 18 (10) : 915-. ScholarBank@NUS Repository. https://doi.org/10.1016/j.jprocont.2008.11.002
dc.identifier.issn09591524
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/114592
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1016/j.jprocont.2008.11.002
dc.sourceScopus
dc.typeEditorial
dc.contributor.departmentELECTRICAL & COMPUTER ENGINEERING
dc.description.doi10.1016/j.jprocont.2008.11.002
dc.description.sourcetitleJournal of Process Control
dc.description.volume18
dc.description.issue10
dc.description.page915-
dc.description.codenJPCOE
dc.identifier.isiut000261897200001
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