Please use this identifier to cite or link to this item: https://doi.org/10.1016/S0304-3991(00)00019-X
DC FieldValue
dc.titleUse of the track structure approach in TEM
dc.contributor.authorBourdillon, A.J.
dc.date.accessioned2014-11-28T08:43:39Z
dc.date.available2014-11-28T08:43:39Z
dc.date.issued2000-06
dc.identifier.citationBourdillon, A.J. (2000-06). Use of the track structure approach in TEM. Ultramicroscopy 83 (3-4) : 261-264. ScholarBank@NUS Repository. https://doi.org/10.1016/S0304-3991(00)00019-X
dc.identifier.issn03043991
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/113046
dc.description.abstractTrack structures can be usefully used to understand concepts and measurements not adequately treated by conventional scattering theory using the Born approximation. An example is the impact parameter used experimentally in energy-loss and energy-dispersive spectroscopies in the transmission electron microscope. An anomaly is discussed which derives from the wave-particle duality in quantum mechanics in the context of near relativistic speeds encountered in the electron microscope. Copyright (C) 2000 Elsevier Science B.V.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1016/S0304-3991(00)00019-X
dc.sourceScopus
dc.subjectElectron energy-loss
dc.subjectImpact parameter
dc.subjectTEM
dc.typeArticle
dc.contributor.departmentSINGAPORE SYNCHROTRON LIGHT SOURCE
dc.description.doi10.1016/S0304-3991(00)00019-X
dc.description.sourcetitleUltramicroscopy
dc.description.volume83
dc.description.issue3-4
dc.description.page261-264
dc.description.codenULTRD
dc.identifier.isiut000087227000010
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