Please use this identifier to cite or link to this item:
Title: Two-dimensional in-plane electronic speckle pattern interferometer and its application to residual stress determination
Authors: Zhang, J. 
Keywords: Electronic speckle pattern interferometry (ESPI)
Hole-drilling technique
In-plane displacement
Residual stress/strain
Issue Date: Aug-1998
Citation: Zhang, J. (1998-08). Two-dimensional in-plane electronic speckle pattern interferometer and its application to residual stress determination. Optical Engineering 37 (8) : 2402-2409. ScholarBank@NUS Repository.
Abstract: Based on the dual-beam illumination principle of Leendertz, an electronic speckle pattern interferometer (ESPI) is developed to determine separately two orthogonal components of the in-plane displacement field. In the arrangement described, the lengths of the illumination beams were reduced to make the optical setup compact. The CCD camera for recording images is placed outside the area enclosed by the optical path, and adequate working space is provided between the camera and the test rig, so that adjustments can be made without interfering with the light beams. Using a customized telephoto lens, different areas in the range of 5.6x4.0 and 14x10 mm2 can be examined at a distance of 550 mm from the test piece. Combined with the blind-hole-drilling method, it is applied to residual stress determination, which is a challenging task due to stress concentration and severe decorrelation in the area neighboring the drilled hole. © 1998 Society of Photo-Optical Instrumentation Engineers.
Source Title: Optical Engineering
ISSN: 00913286
Appears in Collections:Staff Publications

Show full item record
Files in This Item:
There are no files associated with this item.

Page view(s)

checked on Feb 2, 2023

Google ScholarTM


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.