Please use this identifier to cite or link to this item: https://doi.org/10.1109/20.706607
Title: Effects of thin cr interlayer on time decay of magnetization and magnetization reversal for CoCrTaPt thin film media
Authors: Wang, J.P. 
Tan, L.P. 
Liew, T.Y.F. 
Teng, E.
Wang, P.-W.
Keywords: Anisotropy, cr interlayer, time decay of magnetization, magnetization reversal
Issue Date: 1998
Citation: Wang, J.P.,Tan, L.P.,Liew, T.Y.F.,Teng, E.,Wang, P.-W. (1998). Effects of thin cr interlayer on time decay of magnetization and magnetization reversal for CoCrTaPt thin film media. IEEE Transactions on Magnetics 34 (4 PART 1) : 1537-1539. ScholarBank@NUS Repository. https://doi.org/10.1109/20.706607
Abstract: The effect of thin Cr interlayer on the time decay of magnetization and magnetization reversal for CoCrTaPt /Cr/ CoCrTaPt media is presented. The time decay of magnetization was measured at various reverse magnetic fields. The maximum magnetic viscosity coefficient which occurs around the remanent coercivity increases with increasing interlayer thickness, which implies the degradation of thermal stability. The activation volume decreases with increasing Cr interlayer thickness. Both torque magnetometer and the law of approach to saturation methods were used to measure the magnetic anisotropy. The results show a decrease in anisotropy with increasing interlayer thickness which may explain the degradation of thermal stability. The distribution of rotational hysteresis losses (Wr) were measured and the rotational hysteresis integral (Rh) was found to decrease with increasing Cr interlayer thickness which may be caused by reduction of the magnetic interaction. © 1998 IEEE.
Source Title: IEEE Transactions on Magnetics
URI: http://scholarbank.nus.edu.sg/handle/10635/112699
ISSN: 00189464
DOI: 10.1109/20.706607
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