Please use this identifier to cite or link to this item: https://doi.org/10.1002/adma.200602837
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dc.titleA new scenario in probe local oxidation: Transient pressure-wave-assisted ionic spreading and oxide pattern formation
dc.contributor.authorXie, X.N.
dc.contributor.authorChung, H.J.
dc.contributor.authorLiu, Z.J.
dc.contributor.authorYang, S.-W.
dc.contributor.authorSow, C.H.
dc.contributor.authorWee, A.T.S.
dc.date.accessioned2014-11-28T06:32:58Z
dc.date.available2014-11-28T06:32:58Z
dc.date.issued2007-09-17
dc.identifier.citationXie, X.N., Chung, H.J., Liu, Z.J., Yang, S.-W., Sow, C.H., Wee, A.T.S. (2007-09-17). A new scenario in probe local oxidation: Transient pressure-wave-assisted ionic spreading and oxide pattern formation. Advanced Materials 19 (18) : 2618-2623. ScholarBank@NUS Repository. https://doi.org/10.1002/adma.200602837
dc.identifier.issn09359648
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/112574
dc.description.abstractA new mechanism of shock-wave-assisted OH- ionic spreading in AFM anodic oxidation which is at work under relatively high tip biases, high tip currents, and high humidity conditions is reported. This involves the transport of OH- reactants by transient shock-wave (SW) propagation. SW propagation can drastically influence the formation of oxide patterns by fully or partially extending the distribution of OH- oxidants. The ultrafast propagation of transient shock waves significantly extends the lateral distribution of the OH- reactant, leading to the formation of unique oxide patterns. A hydrodynamic simulation was performed to quantitatively describe the ionic- spreading mechanism in terms of shock pressure and propagation distance.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1002/adma.200602837
dc.sourceScopus
dc.typeArticle
dc.contributor.departmentNUS NANOSCIENCE & NANOTECH INITIATIVE
dc.contributor.departmentPHYSICS
dc.description.doi10.1002/adma.200602837
dc.description.sourcetitleAdvanced Materials
dc.description.volume19
dc.description.issue18
dc.description.page2618-2623
dc.description.codenADVME
dc.identifier.isiut000249969100041
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