Please use this identifier to cite or link to this item: https://scholarbank.nus.edu.sg/handle/10635/112553
Title: Measuring atomic oscillator strengths by single atom spectroscopy
Authors: Lee, J.
Aljunid, S.A. 
Meng, K.T. 
Chng, B. 
Maslennikov, G. 
Kurtsiefer, C. 
Issue Date: 2009
Citation: Lee, J.,Aljunid, S.A.,Meng, K.T.,Chng, B.,Maslennikov, G.,Kurtsiefer, C. (2009). Measuring atomic oscillator strengths by single atom spectroscopy. 2009 Conference on Lasers and Electro-Optics and 2009 Conference on Quantum Electronics and Laser Science Conference, CLEO/QELS 2009 : -. ScholarBank@NUS Repository.
Abstract: We propose a method for assessing the oscillator strengths of atomic transitions based on single atom spectroscopy. The method is based on a direct measurement of an AC Stark shift of atomic energy levels for the single atom trapped in an optical tweezer. The method is independent on a knowledge of the trapping field at the atom. The results can be applied to obtaining the previously unknown oscillator strengths for dipole transitions involving the first excited state of alkali metals. ©2009 Optical Society of America.
Source Title: 2009 Conference on Lasers and Electro-Optics and 2009 Conference on Quantum Electronics and Laser Science Conference, CLEO/QELS 2009
URI: http://scholarbank.nus.edu.sg/handle/10635/112553
ISBN: 9781557528698
Appears in Collections:Staff Publications

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