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Please use this identifier to cite or link to this item: https://scholarbank.nus.edu.sg/handle/10635/112282
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dc.titleOptically controlled Bragg reflection characteristic of millimeter waves in a corrugated dielectric waveguide
dc.contributor.authorAlphones, A.
dc.contributor.authorTsutsumi, M.
dc.date.accessioned2014-11-28T04:59:17Z
dc.date.available2014-11-28T04:59:17Z
dc.date.issued1998
dc.identifier.citationAlphones, A.,Tsutsumi, M. (1998). Optically controlled Bragg reflection characteristic of millimeter waves in a corrugated dielectric waveguide. Microwave and Optical Technology Letters 17 (6) : 352-357. ScholarBank@NUS Repository.
dc.identifier.issn08952477
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/112282
dc.description.abstractA corrugated dielectric waveguide with silicon overlay has been analyzed by coupled mode theory to study the variation of Bragg reflection characteristics. By optical illumination, the plasma-induced semiconductor exhibits an interesting behavior on the propagation characteristics of a corrugated dielectric waveguide. To validate theoretical estimations, experiments have been carried out at Q-band. The results could be used for optically controlled filters and switches at millimeter-wave band. © 1998 John Wiley & Sons, Inc.
dc.sourceScopus
dc.subjectCoupled mode analysis
dc.subjectMillimeter-wave circuit
dc.subjectOptical control
dc.subjectPeriodic structure
dc.subjectSemiconductor plasma
dc.typeArticle
dc.contributor.departmentCENTRE FOR WIRELESS COMMUNICATIONS
dc.description.sourcetitleMicrowave and Optical Technology Letters
dc.description.volume17
dc.description.issue6
dc.description.page352-357
dc.description.codenMOTLE
dc.identifier.isiutNOT_IN_WOS
Appears in Collections:Staff Publications

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