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Please use this identifier to cite or link to this item: https://doi.org/10.1109/TMTT.2003.808664
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dc.titleImpedance matching for the multilayer medium - Toward a design methodology
dc.contributor.authorHock, K.M.
dc.date.accessioned2014-11-28T01:51:58Z
dc.date.available2014-11-28T01:51:58Z
dc.date.issued2003-03
dc.identifier.citationHock, K.M. (2003-03). Impedance matching for the multilayer medium - Toward a design methodology. IEEE Transactions on Microwave Theory and Techniques 51 (3) : 908-914. ScholarBank@NUS Repository. https://doi.org/10.1109/TMTT.2003.808664
dc.identifier.issn00189480
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/111417
dc.description.abstractA graphical analysis of the impedance matching problem for the multilayer dielectric and magnetic coating of metallic surfaces, for normal plane wave incidence, is presented, with a view to providing insight into design principles. Methods for visual design using Smith-chart-type graphical tools, which can complement computationally intensive optimization, are derived. The problem of estimating the required permittivity and permeability for given frequency and thickness is also discussed.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1109/TMTT.2003.808664
dc.sourceScopus
dc.subjectImpedance matching
dc.subjectMicrowave
dc.subjectMultilayer
dc.typeArticle
dc.contributor.departmentTEMASEK LABORATORIES
dc.description.doi10.1109/TMTT.2003.808664
dc.description.sourcetitleIEEE Transactions on Microwave Theory and Techniques
dc.description.volume51
dc.description.issue3
dc.description.page908-914
dc.description.codenIETMA
dc.identifier.isiut000182000700030
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