Thin films: Stress, strain and structure-property relations

Please use this identifier to cite or link to this item: https://doi.org/10.1016/S0040-6090(02)00899-4

Title:	Thin films: Stress, strain and structure-property relations
Authors:	Yeadon, M. Kaiyang, Z. Hoon, H.H. Twesten, R.D. Abothu, R.
Issue Date:	22-Jan-2003
Citation:	Yeadon, M., Kaiyang, Z., Hoon, H.H., Twesten, R.D., Abothu, R. (2003-01-22). Thin films: Stress, strain and structure-property relations. Thin Solid Films 424 (1) : 1-. ScholarBank@NUS Repository. https://doi.org/10.1016/S0040-6090(02)00899-4
Source Title:	Thin Solid Films
URI:	http://scholarbank.nus.edu.sg/handle/10635/107322
ISSN:	00406090
DOI:	10.1016/S0040-6090(02)00899-4
Appears in Collections:	Staff Publications

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