Please use this identifier to cite or link to this item: https://doi.org/10.1016/j.tsf.2004.08.185
DC FieldValue
dc.titleNovel azobenzene-containing polyamic acids as Langmuir-Blodgett-Kuhn multilayer films and for liquid crystal alignment switching
dc.contributor.authorZong, Y.
dc.contributor.authorRühe, J.
dc.contributor.authorKnoll, W.
dc.date.accessioned2014-10-29T08:42:19Z
dc.date.available2014-10-29T08:42:19Z
dc.date.issued2005-04-22
dc.identifier.citationZong, Y., Rühe, J., Knoll, W. (2005-04-22). Novel azobenzene-containing polyamic acids as Langmuir-Blodgett-Kuhn multilayer films and for liquid crystal alignment switching. Thin Solid Films 477 (1-2) : 203-206. ScholarBank@NUS Repository. https://doi.org/10.1016/j.tsf.2004.08.185
dc.identifier.issn00406090
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/107295
dc.description.abstractNew azobenzene-containing polyamic acids (PAAs) with systematically tailored architectures were synthesized and assembled as Langmuir-Blodgett-Kuhn (LBK) multilayers. Surface plasmon resonance (SPR) spectroscopy was employed to measure the film thickness and its dependence upon the number of layers deposited. The pronounced Bragg peak in the X-ray reflectivity scans indicated the films' regularly repeated internal layer structure. Photoisomerization studies confirmed the excellent reversibility of the trans-cis and cis-trans isomerization reactions of the azobenzene sidegroups within the multilayer structures. Further, these films were found to be able to switch the orientation of liquid crystalline layers between homeotropic and planar alignment by the reversible photoisomerization of the azobenzene moieties. © 2004 Elsevier B.V. All rights reserved.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1016/j.tsf.2004.08.185
dc.sourceScopus
dc.subjectBragg peak
dc.subjectLangmuir-Blodgett-Kuhn films
dc.subjectLiquid crystal alignment switching
dc.subjectPolyamic acids
dc.subjectPolyimides
dc.subjectSurface plasmon resonance spectroscopy
dc.subjectX-ray reflectivity
dc.typeConference Paper
dc.contributor.departmentMATERIALS SCIENCE
dc.description.doi10.1016/j.tsf.2004.08.185
dc.description.sourcetitleThin Solid Films
dc.description.volume477
dc.description.issue1-2
dc.description.page203-206
dc.description.codenTHSFA
dc.identifier.isiut000227825600034
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