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Please use this identifier to cite or link to this item: https://doi.org/10.1063/1.1540133
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dc.titleInvestigation of the crystallographic texture and interface roughness on CoCrPt/Ti magnetic thin films
dc.contributor.authorSun, C.J.
dc.contributor.authorChow, G.M.
dc.contributor.authorWang, J.P.
dc.contributor.authorSoo, E.W.
dc.contributor.authorJe, J.H.
dc.date.accessioned2014-10-29T08:42:05Z
dc.date.available2014-10-29T08:42:05Z
dc.date.issued2003-05-15
dc.identifier.citationSun, C.J., Chow, G.M., Wang, J.P., Soo, E.W., Je, J.H. (2003-05-15). Investigation of the crystallographic texture and interface roughness on CoCrPt/Ti magnetic thin films. Journal of Applied Physics 93 (10 3) : 8725-8727. ScholarBank@NUS Repository. https://doi.org/10.1063/1.1540133
dc.identifier.issn00218979
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/107284
dc.description.abstractThe correlation of the structure of the magnetic layer and of the interface of the magnetic layer and underlayer with the sputtering pressure was studied. Its effects on the magnetic properties of sputtered films was reported. Improved magnetic properties resulted from the combined effects of the higher crystallinity and better texture of the CoCrPt (002) film, and the higher interface roughness.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1063/1.1540133
dc.sourceScopus
dc.typeConference Paper
dc.contributor.departmentMATERIALS SCIENCE
dc.description.doi10.1063/1.1540133
dc.description.sourcetitleJournal of Applied Physics
dc.description.volume93
dc.description.issue10 3
dc.description.page8725-8727
dc.description.codenJAPIA
dc.identifier.isiut000182822600358
Appears in Collections:Staff Publications

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