Please use this identifier to cite or link to this item: https://scholarbank.nus.edu.sg/handle/10635/107047
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dc.titleFlash temperature induced magnetic degradation in high density magnetic recording
dc.contributor.authorYuan, Z.-M.
dc.contributor.authorLiu, B.
dc.contributor.authorWang, J.
dc.contributor.authorDing, J.
dc.date.accessioned2014-10-29T08:38:41Z
dc.date.available2014-10-29T08:38:41Z
dc.date.issued2000-05-01
dc.identifier.citationYuan, Z.-M.,Liu, B.,Wang, J.,Ding, J. (2000-05-01). Flash temperature induced magnetic degradation in high density magnetic recording. Journal of Applied Physics 87 (9 III) : 6158-6160. ScholarBank@NUS Repository.
dc.identifier.issn00218979
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/107047
dc.description.abstractSlider disk impact, especially the impact with particles in between, generates flash temperatures at the contact area and creates thermal stress in the magnetic layer of disk media. By modeling the effective magnetic fields of the thermal stress and the thermal agitation, the flash temperature induced magnetic degradation is studied via micro-magnetic simulation. It is noticed that the recorded bit pattern can be fully erased near the area of the maximum thermal stress if the flash temperature approaches 673 K (grain size: 12 nm). The bit patterns with higher bit density corresponds to higher likelihood of data erasure if other conditions are the same. © 2000 American Institute of Physics.
dc.sourceScopus
dc.typeArticle
dc.contributor.departmentMATERIALS SCIENCE
dc.description.sourcetitleJournal of Applied Physics
dc.description.volume87
dc.description.issue9 III
dc.description.page6158-6160
dc.description.codenJAPIA
dc.identifier.isiutNOT_IN_WOS
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