1. ScholarBank@NUS

Pan Yang

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Full Name
Pan Yang
Variants
Pan, Y.
 
Main Affiliation
 
Faculty
 

Publications

Results 1-5 of 5 (Search time: 0.002 seconds).

Issue DateTitleAuthor(s)
11994A novel hot carrier reliability monitor for LDD p-MOSFETsPan, Y. ; Ng, K.K.; Kwong, V.
21998A novel single-device DC method for extraction of the effective mobility and source-drain resistances of fresh and hot-carrier degraded drain-engineered MOSFET'sLou, C.-L.; Chim, W.-K.; Chan, D.S.-H.; Pan, Y. 
31995Characterization of the gate oxide thickness and the channel length dependencies of hot-carrier degradation in LDD p-MOSFETsPan, Y. ; Ng, K.K.
4Feb-1994Experimental study of the Fowler-Nordheim tunneling induced degradation of LDD PMOSFET'sPan, Y. 
51992Modelling of band tails and their effects on minority carrier transport in heavily doped siliconPan, Y. ; Jain, S.C.; Kleffstra, M.; Balk, P.