Pan Yang

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Full Name

Pan Yang

Variants

Pan, Y.

Main Affiliation

ELECTRICAL AND COMPUTER ENGINEERING

Faculty

FAC OF ENGINEERING

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Type: Article

Results 1-5 of 5 (Search time: 0.003 seconds).

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	Issue Date	Title	Author(s)
1	1994	A novel hot carrier reliability monitor for LDD p-MOSFETs	Pan, Y. ; Ng, K.K.; Kwong, V.
2	1998	A novel single-device DC method for extraction of the effective mobility and source-drain resistances of fresh and hot-carrier degraded drain-engineered MOSFET's	Lou, C.-L.; Chim, W.-K.; Chan, D.S.-H.; Pan, Y.
3	1995	Characterization of the gate oxide thickness and the channel length dependencies of hot-carrier degradation in LDD p-MOSFETs	Pan, Y. ; Ng, K.K.
4	Feb-1994	Experimental study of the Fowler-Nordheim tunneling induced degradation of LDD PMOSFET's	Pan, Y.
5	1992	Modelling of band tails and their effects on minority carrier transport in heavily doped silicon	Pan, Y. ; Jain, S.C.; Kleffstra, M.; Balk, P.