Please use this identifier to cite or link to this item: https://doi.org/10.1117/12.607273
Title: Ballistic emission spectroscopy and imaging of a buried metal-organic interface
Authors: Chandrasekhar, N. 
Troadec, C.
Kunardi, L.
Keywords: BEEM
Carrier injection
Interface
Schottky barrier
STM
Issue Date: 2005
Citation: Chandrasekhar, N., Troadec, C., Kunardi, L. (2005). Ballistic emission spectroscopy and imaging of a buried metal-organic interface. Proceedings of SPIE - The International Society for Optical Engineering 5774 : 43-47. ScholarBank@NUS Repository. https://doi.org/10.1117/12.607273
Abstract: Metal organic interfaces have been under intensive scientific investigation over the past few years with the objective of improving devices based on organic materials. In this study, we report the first results on spectroscopy and imaging of a buried metal-organic interface using ballistic electron emission microscopy (BEEM). Unlike photoexcitation-based experiments, which typically average over large interfacial areas, BEEM enables direct observation of local interface band structure with nanometer resolution. The interface of silver (Ag) - polyparaphenylene (PPP, a blue emitter with high photoluminescence efficiency) is investigated. Multiple injection barriers and spatial non-uniformity of carrier injection are observed. Possible causes for these features will be discussed. The BEEM current images are found to correlate marginally with the surface topography of the silver film.
Source Title: Proceedings of SPIE - The International Society for Optical Engineering
URI: http://scholarbank.nus.edu.sg/handle/10635/98641
ISSN: 0277786X
DOI: 10.1117/12.607273
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