Ballistic electron microscopy of a metal molecule interface

Please use this identifier to cite or link to this item: https://doi.org/10.1109/NANOEL.2006.1609710

Title:	Ballistic electron microscopy of a metal molecule interface
Authors:	Kunardi, L. Yi, Z. Troadec, C. Lwin, M.H.T. Knoll, W. Chandrasekhar, N.
Issue Date:	2006
Citation:	Kunardi, L., Yi, Z., Troadec, C., Lwin, M.H.T., Knoll, W., Chandrasekhar, N. (2006). Ballistic electron microscopy of a metal molecule interface. NanoSingapore 2006: IEEE Conference on Emerging Technologies - Nanoelectronics - Proceedings 2006 : 194-196. ScholarBank@NUS Repository. https://doi.org/10.1109/NANOEL.2006.1609710
Abstract:	We present studies on a Ag/ HS-(CH2)4-T3-H (T3C4SH)/ Au diode using nanometer scale resolution, ballistic electron emission microscopy (BEEM). Images show spatially non-uniform carrier injection. A WKB calculation is carried out and compared with the experimental data. The results indicate that molecular levels are being accessed in the BEEM experiment, since the measured currents are larger than purely tunneling contribution. Our results are consistent with previously published results on a similar molecule [1]. Physical origins of the non-uniform carrier injection and its implications are discussed. © 2006 IEEE.
Source Title:	NanoSingapore 2006: IEEE Conference on Emerging Technologies - Nanoelectronics - Proceedings
URI:	http://scholarbank.nus.edu.sg/handle/10635/98640
ISBN:	0780393589
DOI:	10.1109/NANOEL.2006.1609710
Appears in Collections:	Staff Publications

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