X-ray photoelectron spectroscopy studies on poly-(ethylene oxide) with sodium triflate

Abstract

Poly(ethylene oxide) films with different concentrations of sodium triflate were prepared by the usual solvent casting process in anhydrous conditions. Structural characteristics for each salt concentration were identified using x-ray photoelectron spectroscopy (XPS) for the first time. Further, thermal and x-ray diffraction techniques were used to characterize the crystalline and amorphous phases and to correlate these data with the results obtained with x-ray photoelectron spectroscopy. The interaction between poly(ethylene oxide) (PEO) and sodium triflate in the concentration range of n = 128, 64, 32,16, 8, and 4 in the general formula (PEO)n-NaCF3SO3 is described. The XPS-studies reveal a characteristic interaction of the -C-C-O- chain of PEO with the cations of NaCF3SO3 for each salt concentrations. The interaction results in a rearrangement of the -C-C-O- chain which is strongest in PEO16NaCF3SO3.