Please use this identifier to cite or link to this item: https://doi.org/10.1063/1.354780
Title: Variation of trapping/detrapping properties as a function of the insulator size
Authors: Oh, K.H. 
Ong, C.K. 
Tan, B.T.G. 
Gressus, C.L.
Blaise, G.
Issue Date: 1993
Citation: Oh, K.H., Ong, C.K., Tan, B.T.G., Gressus, C.L., Blaise, G. (1993). Variation of trapping/detrapping properties as a function of the insulator size. Journal of Applied Physics 74 (3) : 1960-1967. ScholarBank@NUS Repository. https://doi.org/10.1063/1.354780
Abstract: Using the scanning electron microscope we have investigated the physical parameters determining the size effect of various dielectric samples submitted to a surface electric field. It is shown that the size effect is a function of the static permittivity and of the space charge distribution. The results are explained by the consideration of charge diffusion and polarization relaxation processes resulting from the space charge formation. A one-dimensional mathematical model has also been used to describe space charge distribution. The findings were consistent with the experimental observations.
Source Title: Journal of Applied Physics
URI: http://scholarbank.nus.edu.sg/handle/10635/98548
ISSN: 00218979
DOI: 10.1063/1.354780
Appears in Collections:Staff Publications

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