Please use this identifier to cite or link to this item: https://doi.org/10.1063/1.2135393
Title: Transmission ion channeling analysis of isolated 60° misfit dislocations
Authors: Breese, M.B.H. 
Huang, L.
Teo, E.J. 
King, P.J.C.
Wilshaw, P.R.
Issue Date: 2005
Citation: Breese, M.B.H., Huang, L., Teo, E.J., King, P.J.C., Wilshaw, P.R. (2005). Transmission ion channeling analysis of isolated 60° misfit dislocations. Applied Physics Letters 87 (21) : 1-3. ScholarBank@NUS Repository. https://doi.org/10.1063/1.2135393
Abstract: High-contrast transmission channeling images and linescans of isolated bunches and individual 60° misfit dislocations in thick partially relaxed Si1-x Gex Si layers are presented. Changes in dislocation contrast with tilt angle are explained using a model of planar dechanneling by the two-edge components of 60° dislocations. By careful analysis of the tilting contrast, all of the four possible combinations of the two-edge components of the Burger's vector of 60° dislocations may be distinguished. © 2005 American Institute of Physics.
Source Title: Applied Physics Letters
URI: http://scholarbank.nus.edu.sg/handle/10635/98440
ISSN: 00036951
DOI: 10.1063/1.2135393
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