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https://doi.org/10.1016/j.susc.2004.09.004
| Title: | Thickness dependent valence fluctuation of CeN film | Authors: | Xiao, W. Guo, Q. Wang, E.G. |
Keywords: | Auger electron spectroscopy Cerium Nitrides X-ray photoelectron spectroscopy |
Issue Date: | 20-Nov-2004 | Citation: | Xiao, W., Guo, Q., Wang, E.G. (2004-11-20). Thickness dependent valence fluctuation of CeN film. Surface Science 572 (2-3) : 296-300. ScholarBank@NUS Repository. https://doi.org/10.1016/j.susc.2004.09.004 | Abstract: | CeN films with different thickness are synthesized on a Re(0001) substrate and studied by X-ray photoelectron spectroscopy (XPS) and Auger electron spectroscopy. A thickness dependent valence fluctuation is observed by XPS. Valence fluctuation only occurs with film thickness larger than a critical value of about 15nm. This interesting phenomenon is mainly attributed to the stress in CeN films due to the large lattice mismatch between the CeN film and the substrate, and a possible composition deviation at the interface. © 2004 Elsevier B.V. All rights reserved. | Source Title: | Surface Science | URI: | http://scholarbank.nus.edu.sg/handle/10635/98391 | ISSN: | 00396028 | DOI: | 10.1016/j.susc.2004.09.004 |
| Appears in Collections: | Staff Publications |
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