Please use this identifier to cite or link to this item: https://doi.org/10.1021/nn9015218
Title: Structural analysis of pentacene thin film growth on polycrystalline O x-Au surfaces using scanning tunneling microscopy
Authors: Zheng, Y. 
Shen Wee, A.T.
Chandrasekhar, N.
Keywords: Pantacene
STM
Structural analysis
Thin film growth
Issue Date: 27-Apr-2010
Citation: Zheng, Y., Shen Wee, A.T., Chandrasekhar, N. (2010-04-27). Structural analysis of pentacene thin film growth on polycrystalline O x-Au surfaces using scanning tunneling microscopy. ACS Nano 4 (4) : 2104-2108. ScholarBank@NUS Repository. https://doi.org/10.1021/nn9015218
Abstract: In this letter, we show the feasibility to use scanning tunneling microscopy (STM) as a stand-alone technique in analyzing the structure of organic thin films grown on polycrystalline metal surfaces. At room temperature, by effectively suppressing the molecule-substrate interaction, pentacene resumes the typical quasi layer-by-layer growth with the "thin-film phase" structure due to intermolecule interaction, while substrate roughness does not play an important role. By elevating the substrate to 320 K, two different polycrystalline phases, that is, the "thin-film phase" and the "single-crystal phase" intermixed grow and form terraced and lamellar structures, respectively. Using STM distance-voltage spectroscopy, the energy level alignment of the underlying organic/metal interfaces can also be acquired. © 2010 American Chemical Society.
Source Title: ACS Nano
URI: http://scholarbank.nus.edu.sg/handle/10635/98046
ISSN: 19360851
DOI: 10.1021/nn9015218
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