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|Title:||Solvent effects on chain orientation and interchain π-interaction in conjugated polymer thin films: Direct measurements of the air and substrate interfaces by near-edge X-ray absorption spectroscopy|
|Authors:||Ho, P.K.-H. |
|Citation:||Ho, P.K.-H., Chua, L.-L., Dipankar, M., Gao, X., Qi, D., Wee, A.T.-S., Chang, J.-F., Friend, R.H. (2007-01-20). Solvent effects on chain orientation and interchain π-interaction in conjugated polymer thin films: Direct measurements of the air and substrate interfaces by near-edge X-ray absorption spectroscopy. Advanced Materials 19 (2) : 215-221. ScholarBank@NUS Repository. https://doi.org/10.1002/adma.200601285|
|Abstract:||Near-edge x-ray absorption fine-structure spectroscopy (NEXAFS) was applied to investigate polymer structures and show that NEXAFS band shapes and intensities are also insensitive to the intermolecular π-interaction in regioregular poly(3-hexylthiophene) films. Delamination was used to expose the substrate interface and it was found that the interchain π-interaction was dependent on the deposition solvent quality. Direct imaging by friction-mode atomic force microscopy (AFM) revealed the expected presence of a mosaic surface morphology with a finer length scale than surface topography. The ability to directly measure chain segmental orientation and interaction at the interfaces could lead to a systematic optimization for even higher device performance. The results show that a strong modification of the NEXAFS spectra was observed and related to π-π interactions between chain segments.|
|Source Title:||Advanced Materials|
|Appears in Collections:||Staff Publications|
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