Please use this identifier to cite or link to this item: https://doi.org/10.1002/adma.200601285
Title: Solvent effects on chain orientation and interchain π-interaction in conjugated polymer thin films: Direct measurements of the air and substrate interfaces by near-edge X-ray absorption spectroscopy
Authors: Ho, P.K.-H. 
Chua, L.-L. 
Dipankar, M.
Gao, X. 
Qi, D. 
Wee, A.T.-S. 
Chang, J.-F.
Friend, R.H.
Issue Date: 20-Jan-2007
Citation: Ho, P.K.-H., Chua, L.-L., Dipankar, M., Gao, X., Qi, D., Wee, A.T.-S., Chang, J.-F., Friend, R.H. (2007-01-20). Solvent effects on chain orientation and interchain π-interaction in conjugated polymer thin films: Direct measurements of the air and substrate interfaces by near-edge X-ray absorption spectroscopy. Advanced Materials 19 (2) : 215-221. ScholarBank@NUS Repository. https://doi.org/10.1002/adma.200601285
Abstract: Near-edge x-ray absorption fine-structure spectroscopy (NEXAFS) was applied to investigate polymer structures and show that NEXAFS band shapes and intensities are also insensitive to the intermolecular π-interaction in regioregular poly(3-hexylthiophene) films. Delamination was used to expose the substrate interface and it was found that the interchain π-interaction was dependent on the deposition solvent quality. Direct imaging by friction-mode atomic force microscopy (AFM) revealed the expected presence of a mosaic surface morphology with a finer length scale than surface topography. The ability to directly measure chain segmental orientation and interaction at the interfaces could lead to a systematic optimization for even higher device performance. The results show that a strong modification of the NEXAFS spectra was observed and related to π-π interactions between chain segments.
Source Title: Advanced Materials
URI: http://scholarbank.nus.edu.sg/handle/10635/97967
ISSN: 09359648
DOI: 10.1002/adma.200601285
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