Raman scattering and x-ray diffraction investigations of highly textured (Pb1-xLax)TiO3 thin films

Please use this identifier to cite or link to this item: https://doi.org/10.1063/1.111611

Title:	Raman scattering and x-ray diffraction investigations of highly textured (Pb1-xLax)TiO3 thin films
Authors:	Feng, Z.C. Kwak, B.S. Erbil, A. Boatner, L.A.
Issue Date:	1994
Citation:	Feng, Z.C., Kwak, B.S., Erbil, A., Boatner, L.A. (1994). Raman scattering and x-ray diffraction investigations of highly textured (Pb1-xLax)TiO3 thin films. Applied Physics Letters 64 (18) : 2350-2352. ScholarBank@NUS Repository. https://doi.org/10.1063/1.111611
Abstract:	Highly textured lead lanthanum titanate (PLT) thin films grown on Si(100) substrates by the metalorganic chemical vapor deposition technique are characterized using x-ray diffraction (XRD), Raman spectroscopy, and energy-dispersive x-ray analysis. The texturing consisted of an alignment of the {100} crystallographic axes of the film perpendicular to the Si substrate. The tetragonality of the films was found to decrease as the lanthanum concentration increased. Raman spectra exhibited features characteristic of bulk PLT, including the observation of the soft mode. Variations of the phonon modes for PLT have been investigated as a function of La concentration and sample temperature.
Source Title:	Applied Physics Letters
URI:	http://scholarbank.nus.edu.sg/handle/10635/97734
ISSN:	00036951
DOI:	10.1063/1.111611
Appears in Collections:	Staff Publications

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