Please use this identifier to cite or link to this item: https://doi.org/10.1088/0953-8984/8/36/004
Title: Premelting disordering of the Si(113) surface studied by tight-binding molecular dynamics
Authors: Wee, T.H.
Feng, Y.P. 
Ong, C.K. 
Poon, H.C. 
Issue Date: 2-Sep-1996
Citation: Wee, T.H., Feng, Y.P., Ong, C.K., Poon, H.C. (1996-09-02). Premelting disordering of the Si(113) surface studied by tight-binding molecular dynamics. Journal of Physics Condensed Matter 8 (36) : 6511-6523. ScholarBank@NUS Repository. https://doi.org/10.1088/0953-8984/8/36/004
Abstract: The fight-binding molecular-dynamics method is used to study melting of the 3 × 1 reconstructed Si(113) surface. It is found that the surface starts to disorder at about 950 K which is consistent with recent low-energy-electron-diffraction and x-ray chiral melting studies. The behaviour of the simulated mean square atomic displacement and static structure factor indicate that the surface disorders anisotropically. A surface quasi-liquid which exhibits properties of both crystalline and liquid phase is observed between 1000 K and 1400 K. Surface-initiated melting of the crystal is expected to take place at a temperature slightly above 1400 K but lower than the bulk melting temperature.
Source Title: Journal of Physics Condensed Matter
URI: http://scholarbank.nus.edu.sg/handle/10635/97582
ISSN: 09538984
DOI: 10.1088/0953-8984/8/36/004
Appears in Collections:Staff Publications

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