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Title: Orientation of thin YBa2Cu3O7-δ/YSZ films characterization by micro-Raman spectroscopy
Authors: Chen, M.S.
Shen, Z.X. 
Zhou, W.Z.
Xu, S.Y. 
Ong, C.K. 
Issue Date: May-1999
Citation: Chen, M.S., Shen, Z.X., Zhou, W.Z., Xu, S.Y., Ong, C.K. (1999-05). Orientation of thin YBa2Cu3O7-δ/YSZ films characterization by micro-Raman spectroscopy. Superconductor Science and Technology 12 (5) : 315-318. ScholarBank@NUS Repository.
Abstract: Micro-Raman scattering of thin YBa2Cu3O7-δ films of various thicknesses, deposited by pulsed laser deposition on the yttrium-stabilized zirconia (001) substrates, was carried out at different scattering geometries. The fraction of c-axis orientation of the films was calculated from the intensity ratio of the O(2,3)-B1g and O(4)-Ag modes. It is shown that it is strongly dependent on the film thickness and the highest fraction of c-axis orientation occurs for film thickness around 80 nm. The lower c-axis fraction for thinner films was explained by the simultaneous growth of a- and c-axis-oriented grains at the interface region, while the lower c-axis fraction for thicker films was due to the faults and voids in the films. Several a- and b-axis in-plane orientations have been identified using polarized Raman spectra.
Source Title: Superconductor Science and Technology
ISSN: 09532048
DOI: 10.1088/0953-2048/12/5/312
Appears in Collections:Staff Publications

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