Please use this identifier to cite or link to this item: https://doi.org/10.1016/S0167-577X(03)00238-6
Title: Microstructural study on multilayer [FeTaN/TaN]5 films
Authors: Zhan, Q.
Yu, R.
He, L.
Li, D.
Nie, H.
Ong, C. 
Keywords: Magnetic materials
Microstructure
Sputtering
Thin films
Transmission electron microscopy (TEM)
Issue Date: Aug-2003
Citation: Zhan, Q., Yu, R., He, L., Li, D., Nie, H., Ong, C. (2003-08). Microstructural study on multilayer [FeTaN/TaN]5 films. Materials Letters 57 (24-25) : 3904-3909. ScholarBank@NUS Repository. https://doi.org/10.1016/S0167-577X(03)00238-6
Abstract: The microstructure of [FeTaN/TaN]5 multilayer films has been investigated by transmission electron microscopy (TEM) and high-resolution electron microscopy (HREM) in cross section and plan view. Each layer shows a small surface roughening less than 1 nm. The FeTaN layers are composed of b.c.c. Fe with Ta incorporated substitutionally and N interstitially, denoted as Fe(Ta,N); while the TaN layers mainly consist of f.c.c. TaN phase. A 〈110〉 texture of Fe(Ta,N) has been formed in the FeTaN layers. The columnar grain structure is a typical feature in FeTaN layers. © 2003 Elsevier Science B.V. All rights reserved.
Source Title: Materials Letters
URI: http://scholarbank.nus.edu.sg/handle/10635/97207
ISSN: 0167577X
DOI: 10.1016/S0167-577X(03)00238-6
Appears in Collections:Staff Publications

Show full item record
Files in This Item:
There are no files associated with this item.

SCOPUSTM   
Citations

6
checked on Oct 14, 2018

WEB OF SCIENCETM
Citations

5
checked on Nov 22, 2017

Page view(s)

39
checked on Oct 12, 2018

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.