Please use this identifier to cite or link to this item: https://doi.org/10.1063/1.2001748
Title: Direct imaging of the end-of-range and surface profiles of proton-beam written erbium-doped waveguide amplifiers by atomic force microscopy
Authors: Sum, T.C.
Bettiol, A.A. 
Van Kan, J.A. 
Venugopal Rao, S. 
Watt, F. 
Liu, K.
Pun, E.Y.B.
Issue Date: 1-Aug-2005
Citation: Sum, T.C., Bettiol, A.A., Van Kan, J.A., Venugopal Rao, S., Watt, F., Liu, K., Pun, E.Y.B. (2005-08-01). Direct imaging of the end-of-range and surface profiles of proton-beam written erbium-doped waveguide amplifiers by atomic force microscopy. Journal of Applied Physics 98 (3) : -. ScholarBank@NUS Repository. https://doi.org/10.1063/1.2001748
Abstract: Buried channel waveguide amplifiers in erbiumybtterbium codoped phosphate glass were fabricated using proton-beam writing. Single-mode waveguides were fabricated with fluences ranging from 0.4 to 2.0× 1015 particles cm2. The end-of-range and surface profiles of the waveguides were investigated using atomic force microscopy. The waveguiding effect was investigated using the end-fire coupling technique. From the near-field mode profiles, the refractive index profiles of these waveguides were recovered using the propagation mode near-field method. From these results, it can be deduced that for phosphate glass waveguides fabricated with fluences
Source Title: Journal of Applied Physics
URI: http://scholarbank.nus.edu.sg/handle/10635/96235
ISSN: 00218979
DOI: 10.1063/1.2001748
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