Please use this identifier to cite or link to this item: https://scholarbank.nus.edu.sg/handle/10635/95883
Title: Bound electronic Kerr effect and self-focusing induced damage in second-harmonic-generation crystals
Authors: Li, H.
Zhou, F.
Zhang, X.
Ji, W. 
Keywords: Nonlinear refractive index and nonlinear absorption
Optical damage
SHG crystals
Z-scan technique
Issue Date: 1-Dec-1997
Citation: Li, H.,Zhou, F.,Zhang, X.,Ji, W. (1997-12-01). Bound electronic Kerr effect and self-focusing induced damage in second-harmonic-generation crystals. Optics Communications 144 (1-3) : 75-81. ScholarBank@NUS Repository.
Abstract: We present an investigation of third-order electronic nonlinearities in second-harmonic-generation (SHG) crystals using a picosecond 532 nm wavelength beam. The crystals studied include KTP, KTA, BBO, LBO and LiNbO3. Using the Z-scan technique the nonlinear refractive indexes and two-photon absorption coefficients in the z-cut crystals are measured, as well as in KTP, BBO and LBO along the phase-matching angles for the SHG of 1064 nm radiation. The microscopic origin of the measured refractive nonlinearity can be understood in terms of bound electronic effects, and the theoretical predictions are in agreement with our measurements. Finally, we perform an experimental study on the self-focusing induced damage in these crystals by extending the Z-scan method. The measured damage threshold is inversely proportional to the nonlinear refractive index and the thickness of a crystal. © 1997 Elsevier Science B.V.
Source Title: Optics Communications
URI: http://scholarbank.nus.edu.sg/handle/10635/95883
ISSN: 00304018
Appears in Collections:Staff Publications

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