Please use this identifier to cite or link to this item: https://doi.org/10.1016/j.jcrysgro.2008.07.062
Title: Observation of interfacial reactions and recrystallization of extrinsic phases in epitaxial grown ZnO/GaAs heterostructures
Authors: Liu, H.F.
Wong, A.S.W.
Hu, G.X. 
Gong, H. 
Keywords: A1. Heterostructures
B1. Zinc compound
B1. ZnO
B2. Semiconducting materials
Issue Date: 15-Sep-2008
Source: Liu, H.F., Wong, A.S.W., Hu, G.X., Gong, H. (2008-09-15). Observation of interfacial reactions and recrystallization of extrinsic phases in epitaxial grown ZnO/GaAs heterostructures. Journal of Crystal Growth 310 (19) : 4305-4308. ScholarBank@NUS Repository. https://doi.org/10.1016/j.jcrysgro.2008.07.062
Abstract: Thermal-induced interfacial reactions and recrystallization of extrinsic phases in ZnO/GaAs heterostructures were observed by using high-resolution X-ray diffraction and transmission electron microscopy. A uniform Zn3As2 interlayer and a defected ZnO interlayer (i.e. embedded with nanoscale ZnGa2O4 domains) are formed, adjacent to each other along the growth direction, at elevated temperatures. The anomalous distribution of Zn and Ga elements over the two interlayers as confirmed by energy-dispersive spectroscopy conflicts with atoms interdiffusion driven only by concentration gradient. Chemical reactions between the diffused cations and the steady anions may accelerate the Ga/Zn atoms interdiffusion and result in the observed structures. © 2008 Elsevier B.V. All rights reserved.
Source Title: Journal of Crystal Growth
URI: http://scholarbank.nus.edu.sg/handle/10635/86602
ISSN: 00220248
DOI: 10.1016/j.jcrysgro.2008.07.062
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