Please use this identifier to cite or link to this item:
|Title:||Observation of interfacial reactions and recrystallization of extrinsic phases in epitaxial grown ZnO/GaAs heterostructures|
B1. Zinc compound
B2. Semiconducting materials
|Source:||Liu, H.F., Wong, A.S.W., Hu, G.X., Gong, H. (2008-09-15). Observation of interfacial reactions and recrystallization of extrinsic phases in epitaxial grown ZnO/GaAs heterostructures. Journal of Crystal Growth 310 (19) : 4305-4308. ScholarBank@NUS Repository. https://doi.org/10.1016/j.jcrysgro.2008.07.062|
|Abstract:||Thermal-induced interfacial reactions and recrystallization of extrinsic phases in ZnO/GaAs heterostructures were observed by using high-resolution X-ray diffraction and transmission electron microscopy. A uniform Zn3As2 interlayer and a defected ZnO interlayer (i.e. embedded with nanoscale ZnGa2O4 domains) are formed, adjacent to each other along the growth direction, at elevated temperatures. The anomalous distribution of Zn and Ga elements over the two interlayers as confirmed by energy-dispersive spectroscopy conflicts with atoms interdiffusion driven only by concentration gradient. Chemical reactions between the diffused cations and the steady anions may accelerate the Ga/Zn atoms interdiffusion and result in the observed structures. © 2008 Elsevier B.V. All rights reserved.|
|Source Title:||Journal of Crystal Growth|
|Appears in Collections:||Staff Publications|
Show full item record
Files in This Item:
There are no files associated with this item.
checked on Feb 13, 2018
WEB OF SCIENCETM
checked on Jan 10, 2018
checked on Feb 18, 2018
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.