Please use this identifier to cite or link to this item: https://doi.org/10.1002/adma.200803701
Title: Labile ferroelastic nanodomains in bilayered ferroelectric thin films
Authors: Anbusathaiah, V.
Kan, D.
Kartawidjaja, F.C. 
Mahjoub, R.
Arredondo, M.A.
Wicks, S.
Takeuchi, I.
Wang, J. 
Nagarajan, V.
Issue Date: 11-Sep-2009
Citation: Anbusathaiah, V., Kan, D., Kartawidjaja, F.C., Mahjoub, R., Arredondo, M.A., Wicks, S., Takeuchi, I., Wang, J., Nagarajan, V. (2009-09-11). Labile ferroelastic nanodomains in bilayered ferroelectric thin films. Advanced Materials 21 (34) : 3497-3502. ScholarBank@NUS Repository. https://doi.org/10.1002/adma.200803701
Abstract: Labile ferroelastic nanodomains in bilayered ferroelectric thin films are analyzed. Bilayered thin-film structures comprising of a PbZr 0.3Ti0.7O3 deposited on top of a PbZr 0.7Ti0.3O3 were used in the experiment. The films were deposited by a multistep sol-gel route assisted by spin coating on Pt/Ti/SiO2/Si substrates. X-Ray-diffraction measurements ysung Philips X-pert MRD verified that the structure of the PZT layers was polycrystalline with a preferential orientation along the (001)/(100) direction with small fraction of (111) orientation. The typical gap between each pad was about 10μm. Ferroelectric hystersis loops and PUND measurements were performed using a Radiant Premier II at room temperature. Cross-sectional TEM analysis was performed using a JEOL 3000F TEM operated at an accelerating voltage of 300 KV.
Source Title: Advanced Materials
URI: http://scholarbank.nus.edu.sg/handle/10635/86479
ISSN: 09359648
DOI: 10.1002/adma.200803701
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