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|Title:||Compositional dependence of Young's moduli for amorphous Cu-Zr films measured using combinatorial deposition on microscale cantilever arrays|
Van Vliet, K.J.
|Keywords:||Atomic force microscopy|
|Citation:||Guo, Q., Zhang, L., Zeiger, A.S., Li, Y., Van Vliet, K.J., Thompson, C.V. (2011-01). Compositional dependence of Young's moduli for amorphous Cu-Zr films measured using combinatorial deposition on microscale cantilever arrays. Scripta Materialia 64 (1) : 41-44. ScholarBank@NUS Repository. https://doi.org/10.1016/j.scriptamat.2010.08.061|
|Abstract:||Young's moduli of amorphous Cu-Zr thin films have been determined with unprecedented compositional resolution, via combinatorial film deposition and force-deflection measurements of microscale cantilevers. This elastic property increased monotonically with increasing Cu content. Such cantilever-based surveys of compositional libraries are considerably more rapid than that required of bulk samples. Additionally, interpretation of the film elastic modulus Ef via this approach is advantageous over indentation-based methods, particularly in terms of straightforward calculation that does not require knowledge of the glass's Poisson's ratio. © 2010 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.|
|Source Title:||Scripta Materialia|
|Appears in Collections:||Staff Publications|
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