Please use this identifier to cite or link to this item: https://doi.org/10.1016/j.electacta.2006.07.014
Title: Properties of nano-crystalline LiMn2O4 thin films deposited by pulsed laser deposition
Authors: Tang, S.B. 
Lai, M.O. 
Lu, L. 
Keywords: Charge/discharge
Cycling stability
Nano-crystalline LiMn2O4 thin films
Pulsed laser deposition
Specific capacity
Issue Date: 12-Nov-2006
Citation: Tang, S.B., Lai, M.O., Lu, L. (2006-11-12). Properties of nano-crystalline LiMn2O4 thin films deposited by pulsed laser deposition. Electrochimica Acta 52 (3) : 1161-1168. ScholarBank@NUS Repository. https://doi.org/10.1016/j.electacta.2006.07.014
Abstract: Properties of LiMn2O4 thin films deposited on polished stainless steel substrates at 400 °C and 200 mTorr of oxygen by pulsed laser deposition have been characterized by electrochemical measurements and physical analyses. The film was mainly composed of nano-crystals less than 100 nm. A maximum specific capacity of 141.9 mAh/g cycled between 3.0 and 4.5 V with a current density of 20 μAh/cm2 has been achieved. The film exhibited an excellent cycling stability up to 500 cycles. The low charge-transfer resistance at high potentials as revealed by AC impedance resulted in high charge/discharge potential and more capacity. The effect of overdischarge was limited and Jahn-Teller effect was overcome to a significant extent in this nano-crystalline film. Ex situ XRD, Raman and XPS provided supporting evidence in the changes in structure, reactivity and cycling stability of nano-crystalline LiMn2O4 film cathodes under different charge/discharge states and cycling tests. SEM images also revealed the stability of the surface topography after a long-term cycling test. © 2006 Elsevier Ltd. All rights reserved.
Source Title: Electrochimica Acta
URI: http://scholarbank.nus.edu.sg/handle/10635/85583
ISSN: 00134686
DOI: 10.1016/j.electacta.2006.07.014
Appears in Collections:Staff Publications

Show full item record
Files in This Item:
There are no files associated with this item.

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.