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|Title:||Negative capacitance induced by redistribution of oxygen vacancies in the fatigued BiFeO 3-based thin film|
|Citation:||Ke, Q., Lou, X., Yang, H., Kumar, A., Zeng, K., Wang, J. (2012-07-09). Negative capacitance induced by redistribution of oxygen vacancies in the fatigued BiFeO 3-based thin film. Applied Physics Letters 101 (2) : -. ScholarBank@NUS Repository. https://doi.org/10.1063/1.4733982|
|Abstract:||The capacitance dispersion in La and Mg co-substituted BiFeO 3 thin film has been studied at different stages of polarization switching. A negative capacitance (NC) behavior is observed in the sample that is fatigued above 10 9 switching cycles. The origin of the NC is investigated through analyzing relaxation processes and charge transport kinetics by admittance spectroscopy. An activation energy of ∼0.6 eV and a zero field mobility μ 0 5.33 ± 0.02 × 10 - 13 m 2 / Vs are thus obtained. A physical mechanism is proposed to explain this behavior. It involves a redistribution of oxygen vacancies, which are trapped at the film/electrode interface during the fatigue process. © 2012 American Institute of Physics.|
|Source Title:||Applied Physics Letters|
|Appears in Collections:||Staff Publications|
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