Please use this identifier to cite or link to this item: https://doi.org/10.1143/JJAP.46.2211
Title: Thickness dependent nano-crystallization in Ge2Sb 2Te5 films and its effect on devices
Authors: Wei, X.
Shi, L.
Chong, T.C. 
Zhao, R.
Lee, H.K.
Keywords: Line-type PCRAM
Nano-crystallization
Phase change material
Thickness-dependent effect
Issue Date: 24-Apr-2007
Citation: Wei, X., Shi, L., Chong, T.C., Zhao, R., Lee, H.K. (2007-04-24). Thickness dependent nano-crystallization in Ge2Sb 2Te5 films and its effect on devices. Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers 46 (4 B) : 2211-2214. ScholarBank@NUS Repository. https://doi.org/10.1143/JJAP.46.2211
Abstract: A thickness dependent nano-crystallization in ultra-thin Ge 2Sb2Te5 films was studied by in-situ exothermal and isothermal electrical resistivity measurements. When the film thickness is below 20 nm, an exponential increase of the crystallization temperature with decreasing film thickness was found. Furthermore, the crystallization speed was decreased with decreasing film thickness. Based on Kissinger plot and Johnson-Mehl-Avarami (JMA) model, the crystallization kinetics including the crystallization mechanism, the corresponding activation barrier and the Avrami coefficient was investigated. The crystallization activation energy increased from 2.86 eV in 30 nm thick film to 4.66 eV in 5nm thick film. The increasing of activation energy was explained by a thickness dependent interfacial energy model and was believed as the main reason for the increasing crystallization temperature. In the films thinner than 10nm, the two-dimensional nucleus growth corresponding to an Armani coefficient n < 1 was proposed to attribute to the decreasing crystallization speed. In addition, the effects of this nano-crystallization on line-type phase change devices were discussed. © 2007 The Japan Society of Applied Physics.
Source Title: Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
URI: http://scholarbank.nus.edu.sg/handle/10635/83202
ISSN: 00214922
DOI: 10.1143/JJAP.46.2211
Appears in Collections:Staff Publications

Show full item record
Files in This Item:
There are no files associated with this item.

SCOPUSTM   
Citations

59
checked on Dec 11, 2018

WEB OF SCIENCETM
Citations

56
checked on Dec 3, 2018

Page view(s)

39
checked on Dec 7, 2018

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.