Please use this identifier to cite or link to this item: https://doi.org/10.1021/nl071254m
Title: Graphene thickness determination using reflection and contrast spectroscopy
Authors: Ni, Z.H.
Wang, H.M.
Kasim, J.
Fan, H.M.
Yu, T.
Wu, Y.H. 
Feng, Y.P. 
Shen, Z.X.
Issue Date: Sep-2007
Citation: Ni, Z.H., Wang, H.M., Kasim, J., Fan, H.M., Yu, T., Wu, Y.H., Feng, Y.P., Shen, Z.X. (2007-09). Graphene thickness determination using reflection and contrast spectroscopy. Nano Letters 7 (9) : 2758-2763. ScholarBank@NUS Repository. https://doi.org/10.1021/nl071254m
Abstract: We have clearly discriminated the single-, bilayer-, and multiple-layer graphene (
Source Title: Nano Letters
URI: http://scholarbank.nus.edu.sg/handle/10635/82426
ISSN: 15306984
DOI: 10.1021/nl071254m
Appears in Collections:Staff Publications

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