Graphene thickness determination using reflection and contrast spectroscopy

Please use this identifier to cite or link to this item: https://doi.org/10.1021/nl071254m

Title:	Graphene thickness determination using reflection and contrast spectroscopy
Authors:	Ni, Z.H. Wang, H.M. Kasim, J. Fan, H.M. Yu, T. Wu, Y.H. Feng, Y.P. Shen, Z.X.
Issue Date:	Sep-2007
Citation:	Ni, Z.H., Wang, H.M., Kasim, J., Fan, H.M., Yu, T., Wu, Y.H., Feng, Y.P., Shen, Z.X. (2007-09). Graphene thickness determination using reflection and contrast spectroscopy. Nano Letters 7 (9) : 2758-2763. ScholarBank@NUS Repository. https://doi.org/10.1021/nl071254m
Abstract:	We have clearly discriminated the single-, bilayer-, and multiple-layer graphene (
Source Title:	Nano Letters
URI:	http://scholarbank.nus.edu.sg/handle/10635/82426
ISSN:	15306984
DOI:	10.1021/nl071254m
Appears in Collections:	Staff Publications

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