Please use this identifier to cite or link to this item: https://doi.org/10.1109/LED.2013.2244056
Title: A junctionless gate-all-around silicon nanowire FET of high linearity and its potential applications
Authors: Wang, T.
Lou, L.
Lee, C. 
Keywords: linearity
silicon nanowire (SiNW) FET
Third-order intermodulation (IM3)
Issue Date: 2013
Citation: Wang, T., Lou, L., Lee, C. (2013). A junctionless gate-all-around silicon nanowire FET of high linearity and its potential applications. IEEE Electron Device Letters 34 (4) : 478-480. ScholarBank@NUS Repository. https://doi.org/10.1109/LED.2013.2244056
Abstract: The linearity of a gate-all-around junctionless silicon nanowire (SiNW) FET has been analyzed. The SiNW FET shows a perfectly linear ID-V G relation and a nearly zero output conductance. The mechanism of its linear behaviors due to degenerate doping level has been also demonstrated. For RF applications, the proposed SiNW FET exhibits a much lower distortion for a whole range of load resistance, making it superior to modern short-channel MOSFET. © 1980-2012 IEEE.
Source Title: IEEE Electron Device Letters
URI: http://scholarbank.nus.edu.sg/handle/10635/81879
ISSN: 07413106
DOI: 10.1109/LED.2013.2244056
Appears in Collections:Staff Publications

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