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|Title:||Minimization of current crowding during turn-off of power GTO devices|
|Citation:||Lee, T.K.,Liang, Y.C. (1994). Minimization of current crowding during turn-off of power GTO devices. PESC Record - IEEE Annual Power Electronics Specialists Conference 1 : 442-449. ScholarBank@NUS Repository.|
|Abstract:||The maximum controllable anode current is influenced by the current crowding phenomenon observed in GTO thyristors during turn-off. This phenomenon initiates (1) the formation of the current filament with a density much higher than its surrounding and leads to the localized thermal instability; and (2) the conductivity modulation at the conduction channel causing a non-uniform electric field distribution within the depletion layer and resulting an early punchthrough breakdown. In this paper, device parameters are optimised by detailed two-dimensional device simulations to minimize the current crowding and at the same time to maintain a low forward voltage drop and short turn-off time. By doing so, the localized thermal stress can be reduced and a more uniform electric field distribution is obtained.|
|Source Title:||PESC Record - IEEE Annual Power Electronics Specialists Conference|
|Appears in Collections:||Staff Publications|
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